Growth of high crystalline quality thin epitaxial CeO2 films on (1102) sapphire

Journal De Physique. IV : JP

Volumn 9 I, Issue 8, 1999, Pages

  Frohlich K ^a   Machajdik, D ^a   Hellemans, L ^a   Snauwaert, J ^a  

^a INSTITUTE OF CHEMISTRY   (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SAPPHIRE; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

CERIUM DIOXIDE; FILM THICKNESS;

FILM GROWTH;

EID: 0343390457     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1999842     Document Type: Article

References (8)

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