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Volumn 21, Issue 4, 1999, Pages 232-237
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Crystallographic orientation assessment by electron backscattered diffraction
a a a a a
a
EPFL
(Switzerland)
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Author keywords
Algorithms; Crystallographic orientation; Data analysis; Data management; Electron diffraction and scattering
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Indexed keywords
ALGORITHMS;
BACKSCATTERING;
COMPUTER AIDED ANALYSIS;
COMPUTER GRAPHICS;
COMPUTER SOFTWARE;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
DATA REDUCTION;
ELECTRON SCATTERING;
METAL CLADDING;
NICKEL ALLOYS;
SUPERALLOYS;
ELECTRON BACKSCATTERED DIFFRACTION (EBSD);
EULER ANGLES;
ELECTRON DIFFRACTION;
ALLOY;
ALGORITHM;
ARTICLE;
COMPUTER PROGRAM;
CRYSTAL STRUCTURE;
DATA ANALYSIS;
ELECTRON DIFFRACTION;
GEOMETRY;
INFORMATION PROCESSING;
MATHEMATICAL ANALYSIS;
PRIORITY JOURNAL;
STRUCTURE ANALYSIS;
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EID: 0343115068
PISSN: 01610457
EISSN: None
Source Type: Journal
DOI: 10.1002/sca.4950210402 Document Type: Article |
Times cited : (14)
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References (10)
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