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Volumn 21, Issue 4, 1999, Pages 232-237

Crystallographic orientation assessment by electron backscattered diffraction

Author keywords

Algorithms; Crystallographic orientation; Data analysis; Data management; Electron diffraction and scattering

Indexed keywords

ALGORITHMS; BACKSCATTERING; COMPUTER AIDED ANALYSIS; COMPUTER GRAPHICS; COMPUTER SOFTWARE; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DATA REDUCTION; ELECTRON SCATTERING; METAL CLADDING; NICKEL ALLOYS; SUPERALLOYS;

EID: 0343115068     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950210402     Document Type: Article
Times cited : (14)

References (10)
  • 1
    • 0031170819 scopus 로고    scopus 로고
    • Orientation imaging microscopy: Emerging and future applications
    • Adams BL: Orientation imaging microscopy: Emerging and future applications. Ultramicroscopy 67, 11-17 (1997)
    • (1997) Ultramicroscopy , vol.67 , pp. 11-17
    • Adams, B.L.1
  • 3
    • 0023361931 scopus 로고
    • On-line analysis of electron back scatter diffraction patterns
    • Dingley DJ, Longden M, Weinbren J, Aldermann J: On-line analysis of electron back scatter diffraction patterns. Scan Microsc 1, No 2, 451-456 (1987)
    • (1987) Scan Microsc , vol.1 , Issue.2 , pp. 451-456
    • Dingley, D.J.1    Longden, M.2    Weinbren, J.3    Aldermann, J.4
  • 4
    • 0031170838 scopus 로고    scopus 로고
    • Recent advances in the application of orientation imaging
    • Field DP: Recent advances in the application of orientation imaging. Ultramicroscopy 67, 1-9 (1997)
    • (1997) Ultramicroscopy , vol.67 , pp. 1-9
    • Field, D.P.1
  • 6
    • 0030826862 scopus 로고    scopus 로고
    • Electron backscattered diffraction investigation of the texture of feathery crystals in aluminium alloys
    • Henry S, Jarry P, Jouneau PH, Rappaz M: Electron backscattered diffraction investigation of the texture of feathery crystals in aluminium alloys. Metallurg Mater Trans A, 28A, 207-213 (1997)
    • (1997) Metallurg Mater Trans A , vol.28 A , pp. 207-213
    • Henry, S.1    Jarry, P.2    Jouneau, P.H.3    Rappaz, M.4
  • 8
    • 0030031516 scopus 로고    scopus 로고
    • The relative precision of crystal orientations measured from electron backscattering patterns
    • Krieger Lassen NC: The relative precision of crystal orientations measured from electron backscattering patterns. J Microsc 181, 72-81 (1996)
    • (1996) J Microsc , vol.181 , pp. 72-81
    • Krieger Lassen, N.C.1
  • 10
    • 0027656570 scopus 로고
    • A review of an automated orientation imaging microscopy
    • Wright SI: A review of an automated orientation imaging microscopy. J Computer Assist Microsc 5 , No 3, 207-221 (1993)
    • (1993) J Computer Assist Microsc , vol.5 , Issue.3 , pp. 207-221
    • Wright, S.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.