Formation of silicon(111) boron surface phases and their influence on the epitaxial growth of silicon and germanium

Thin Solid Films

Volumn 369, Issue 1, 2000, Pages 10-15

  Schulze, J ^a   Baumgartner H ^a   Fink, C ^a   Dollinger, G ^c   Gentchev, I ^c   Gorgens L ^c   Hansch, W ^a   Hoster, H E ^a   Metzger, T H ^b   Paniago, R ^b   Stimpel, T ^a   Sulima, T ^a   Eisele, I ^a  

^a BUNDESWEHR UNIVERSITY MUNICH   (Germany)

^b UNIVERSITY OF MUNICH   (Germany)

^c TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING BORON; SEMICONDUCTING GERMANIUM; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM DOTS; SUBSTRATES; X RAY SCATTERING;

ELASTIC RECOIL DETECTION (ERD);

SEMICONDUCTING SILICON;

EID: 0342794216     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00825-7     Document Type: Article

References (13)

1. Zotov A.V., Kulakov M.A., Bullemer B., Eisele I. Phys. Rev. B. 53:(19):1996;129021.
2. Wong T.M.H., McKinnon A.W., Welland M.E. Surf. Sci. 328. 1995;227.
3. Bedrossian P., Meade R.D., Mortensen K., Chen D.M., Golovchenko J.A., Vanderbilt D. Phys. Rev. Lett. 63:(12):1989;1257.
4. Miyake K., Shigekawa H. Appl. Phys. A. 66:1998;1013.
5. Lyo I.-W, Kaxiras E., Avouris P. Phys. Rev. Lett. 63:(12):1989;1261.
6. Zotov A.V., Kulakov M.A., Ryzhkov S.V., Lifshits V.G., Bullemer B., Eisele I. Surf. Sci. 352-354:1996;358.
7. Zotov A.V., Ryzhkov S.V., Lifshits V.G. Surf. Sci. 328. 1995;95.
8. Zotov A.V., Wittmann F., Lechner J., Ryzhkov S.V., Lifshits V.G., Eisele I. J. Cryst. Growth. 157:1995;344.
9. Rupp T., Messarosch J., Eisele I. J. Cryst. Growth. 183:1998;99.
10. Stimpel T., Schulze J., Hoster H.E., Baumgärtner H., Eisele I. Appl. Surf. Sci. 1999;. accepted for publication, (Proc. ACSIN-5, Aix en Provence, France, 1999).
11. Dollinger G. Habilitationsschrift. 1998.
12. Metzger T.H., Kegel I., Paniago R., et al. Thin Solid Films. 1998;11692.
13. Schulze J., Stimpel T., Baumgärtner H., Eisele I. Appl. Surf. Sci. 1999;. accepted for publication (Proc. ACSIN-5, Aix en Provence, France, 1999).