Waveguide raman microspectroscopy used for local investigation of very thin films

Journal of Raman Spectroscopy

Volumn 28, Issue 12, 1997, Pages 989-993

  Mugnier, J ^a   Urlacher, C ^a   Plenet, J C ^a   Champagnon, B ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

NONDESTRUCTIVE EXAMINATION; RAMAN SPECTROSCOPY; SOL-GEL PROCESS; TITANIUM DIOXIDE;

MICRO RAMAN SPECTROSCOPY; MICROSTRUCTURAL ANALYSIS; NONDESTRUCTIVE METHODS; OPTICAL OBSERVATIONS; RAMAN MICROSPECTROSCOPY; VERY THIN FILMS; WAVE NUMBERS; WAVEGUIDING FILMS;

WAVEGUIDES;

EID: 0342611064     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-4555(199712)28:12<989::aid-jrs193>3.0.co;2-u     Document Type: Article

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