Phase transformation dynamics, melting and stress evolution in dielectric films and at surfaces

Journal of Raman Spectroscopy

Volumn 27, Issue 10, 1996, Pages 765-774

  Exarhos, Gregory J ^a   Hess, Nancy J ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; AMORPHOUS FILMS; CRYSTALLITE SIZE; DIELECTRIC FILMS; OXIDE FILMS; PHASE TRANSITIONS; POTENTIAL ENERGY; RAMAN SPECTROSCOPY; RATE CONSTANTS; SINGLE CRYSTALS; SOL-GEL PROCESS; THIN FILMS;

BULK SINGLE CRYSTALS; DYNAMIC EVOLUTION; DYNAMIC MELTING; DYNAMIC STRESS; PHASE TRANSFORMATION STRESS; PHASE-TRANSFORMATION DYNAMICS; RAMAN MEASUREMENTS; SOL'GEL; STRESS EVOLUTION; THIN-FILMS;

SOL-GELS;

EID: 0042598088     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4555(199610)27:10<765::AID-JRS29>3.0.CO;2-8     Document Type: Article

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