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Volumn 83, Issue 12, 1998, Pages 7685-7692

Pulsed Fowler-Nordheim current stress resistance of Si oxynitride grown with helicon-wave excited nitrogen-argon plasma

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Indexed keywords


EID: 0342499067     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367890     Document Type: Article
Times cited : (11)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.