GaAs/GaAs twist-bonding for compliant substrates: Interface structure and epitaxial growth

Applied Surface Science

Volumn 164, Issue 1-4, 2000, Pages 15-21

  Patriarche, G ^a   Meriadec C ^a   LeRoux, G ^a   Deparis, C ^b   Sagnes, I ^a   Harmand, J C ^a   Glas, F ^a  

^a ORANGE LABS   (France)

^b Centre de Recherches sur l'Hétéroepitaxie et Ses Applications   (France)

Author keywords

Compliant substrate; Dislocations; Epitaxy; Transmission electron microscopy; Twin boundaries; X ray diffraction

Indexed keywords

EID: 0342409364     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00329-9     Document Type: Article

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