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Volumn 7, Issue 3, 1997, Pages 303-317
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Characteristics of far-field scattering by means of surface roughness and variations in subsurface permittivity
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Author keywords
[No Author keywords available]
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Indexed keywords
LIGHT REFLECTION;
PERMITTIVITY;
PERTURBATION TECHNIQUES;
RANDOM PROCESSES;
SURFACE ROUGHNESS;
SURFACES;
SUBSURFACES;
LIGHT SCATTERING;
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EID: 0031173010
PISSN: 09597174
EISSN: None
Source Type: Journal
DOI: 10.1080/13616679709409802 Document Type: Article |
Times cited : (28)
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References (7)
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