Thermal Stability of Pd Schottky Contacts to p-Type 6H-SiC

Materials Science Forum

Volumn 433-436, Issue , 2003, Pages 681-684

  Samiji, M E ^a   Venter, A ^b   Leitch, A W R ^a  

^a NELSON MANDELA METROPOLITAN UNIVERSITY   (South Africa)

^b VISTA UNIVERSITY   (South Africa)

Author keywords

Contacts; Electrical Measurements; Hydrogen Passivation; Pd; SiC

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; ELECTRIC PROPERTIES; LEAKAGE CURRENTS; METALLIZING; SCHOTTKY BARRIER DIODES; THERMODYNAMIC STABILITY;

HYDROGEN PLASMAS;

SILICON CARBIDE;

EID: 0242664955     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.433-436.681     Document Type: Conference Paper

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