Ru Schottky barrier contacts to n- and p-type 6H-SiC

Materials Science Forum

Volumn 353-356, Issue , 2001, Pages 607-610

  Samiji, M E ^a   Van Wyk, E ^a   Wu, L ^a   Venter, A ^b   Leitch, A W R ^a  

^a NELSON MANDELA METROPOLITAN UNIVERSITY   (South Africa)

^b VISTA UNIVERSITY   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; HYDROGEN; LEAKAGE CURRENTS; PLASMAS; RUTHENIUM;

REVERSE BIAS LEAKAGE CURRENT; SCHOTTKY BARRIER CONTACT;

SILICON CARBIDE;

EID: 14344284397     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/msf.353-356.607     Document Type: Article

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