Comparison of morphology and interfacial composition of Pd ultrathin films on 6H-SiC and 4H-SiC at different annealing temperatures

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 17, Issue 4, 1999, Pages 1182-1190

  Lu, W J ^a   Shi, D T ^a   Burger, A ^a   Collins, W E ^a  

^a FISK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012704652     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581792     Document Type: Article

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