X-ray diffraction analysis of Zn0.85Co0.15O powder and thin films

Materials Research Bulletin

Volumn 38, Issue 14, 2003, Pages 1791-1796

  Qi, Zeming ^a   Li, Aixia ^b   Su, Fenglian ^b   Zhou, Shengming ^b   Liu, Yanmei ^b   Zhao, Zongyan ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b ANHUI UNIVERSITY   (China)

Author keywords

A. Oxides; A. Thin films; C. X ray diffraction; D. Crystal structure

Indexed keywords

CHEMICAL REACTIONS; CRYSTAL STRUCTURE; SUBSTRATES; THIN FILMS; ULTRAVIOLET RADIATION; X RAY DIFFRACTION;

SOLID-PHASE REACTIONS;

ZINC COMPOUNDS;

EID: 0242608389     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2003.09.006     Document Type: Article

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