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Volumn 433-436, Issue , 2003, Pages 149-152
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Wide-Area Homoepltaxial Growth of 6H-SiC on Nearly On-Axis (0001) by Chemical Vapor Deposition
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Author keywords
Atomic Force Microscopy AFM; Chemical Vapor Deposition CVD; Homoepitaxial Growth; Nearly On Axis (0001) Face; Surface Step Structures
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
EPITAXIAL GROWTH;
MORPHOLOGY;
NUCLEATION;
SURFACE STEP STRUCTURES;
SILICON CARBIDE;
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EID: 0242581501
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (10)
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