Properties of oriented and graded PZT thin films

Materials Science and Engineering: B

Volumn 104, Issue 3, 2003, Pages 176-179

  Vilquin, B ^a,b   Le Rhun, G ^a   Bouregba, R ^a   Poullain, G ^a  

^a LABORATOIRE CRISMAT   (France)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Ferroelectric; Silicon; Sputtering; Thin films; Transmission electron microscopy

Indexed keywords

COMPOSITION; LEAD COMPOUNDS; LEAKAGE CURRENTS; POLARIZATION; SILICON; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY;

POLARIZATION OFFSET;

THIN FILMS;

EID: 0242335102     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(03)00192-2     Document Type: Conference Paper

References (15)

1. Scott J.F., Araujo C.A. Science. 246:1989;1400.
2. Swartz S.L., Wood V.E. Cond. Mater. News. 1:1992;4.
3. Schubring N.W., Mantese J.V., Micheli A.L., Catalan A.B., Lopez R.J. Phys. Rev. Lett. 68:1992;1778.
4. Mantese J.V., Schubring N.W., Micheli A.L., Catalan A.B. Appl. Phys. Lett. 71:1997;2047.
5. Brazier M., Mc Elfresh M., Mansour S. Appl. Phys. Lett. 72:1998;1121.
6. Mantese J.V., Schubring N.W., Micheli A.L. Appl. Phys. Lett. 79:2001;4007.
7. Aoki K., Fukuda Y., Numuta K., Nishimura A. Jpn. J. Appl. Phys. 33:1994;5155.
8. Muralt P., Maeder T., Sagalowicz L., Hiboux S., Scalese S., Naumovic D., Agostino R.G., Xanthopoulos N., Mathieu H.J., Patthey L., Bullock E.L. J. Appl. Phys. 83:1998;3835.
9. Huang Z., Zhang Q., Whatmore R.W. J. Mater. Sci. Lett. 17:1998;1157.
10. Bouregba R., Poullain G., Vilquin B., Murray H. Mater. Res. Bull. 35:2000;1381.
11. Vilquin B., Le Rhun G., Bouregba R., Poullain G., Murray H. Appl. Surf. Sci. 195:2002;63.
12. Vilquin B., Bouregba R., Poullain G., Murray H. Eur. Phys. J. A.P. 15:2001;157.
13. B. Vilquin, R. Bouregba, G. Poullain, H. Murray, Thin Solid Films 436 (2003) 157.
14. Poullain G., Bouregba R., Vilquin B., Le Rhun G., Murray H. Appl. Phys. Lett. 81:2002;5015.
15. R. Bouregba, G. Poullain, B. Vilquin, G. Le Rhun, J. Appl. Phys. 93 (2003) 5583.