Manufacturing productivity improvement using effectiveness metrics and simulation analysis

International Journal of Production Research

Volumn 41, Issue 3, 2003, Pages 513-527

  Huang, Samuel H ^a   Dismukes, John P ^b   Shi, J ^a   Su, Qi ^b   Razzak, Mousalam A ^c   Bodhale, Rohit ^d   Robinson, D Eugene ^e  

^a University of Cincinnati   (United States)

^b The University of Toledo   (United States)

^c Intelligent Quality Systems   (United States)

^d TransSolutions   (United States)

^e Pilkington North America Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; COMPETITION; COMPUTER SIMULATION; SENSITIVITY ANALYSIS;

MANUFACTURING SYSTEMS;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0242269802     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/0020754021000042391     Document Type: Article

References (17)

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