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Volumn 41, Issue 3, 2003, Pages 513-527

Manufacturing productivity improvement using effectiveness metrics and simulation analysis

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; COMPETITION; COMPUTER SIMULATION; SENSITIVITY ANALYSIS;

EID: 0242269802     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/0020754021000042391     Document Type: Article
Times cited : (160)

References (17)
  • 4
    • 0041076224 scopus 로고
    • Production control: A universal conceptual framework
    • BURBIDGE, J. L., 1990, Production control: a universal conceptual framework. Production Planning and Control, 1, 3-16.
    • (1990) Production Planning and Control , vol.1 , pp. 3-16
    • Burbidge, J.L.1
  • 5
    • 0026866118 scopus 로고
    • Change to group technology: Process organization is obsolete
    • BURBIDGE, J. L., 1992, Change to group technology: process organization is obsolete. International Journal of Production Research, 30, 1209-1219.
    • (1992) International Journal of Production Research , vol.30 , pp. 1209-1219
    • Burbidge, J.L.1
  • 6
    • 0242297046 scopus 로고    scopus 로고
    • Productivity metrics for flexible-sequence cluster tools
    • Department of Industrial Engineering and Operations Research, University of California at Berkeley
    • BUSING, D. and LEACHMAN, R. C., 1998, Productivity metrics for flexible-sequence cluster tools. Technical Report CSM-42, Department of Industrial Engineering and Operations Research, University of California at Berkeley.
    • (1998) Technical Report , vol.CSM-42
    • Busing, D.1    Leachman, R.C.2
  • 9
    • 0031377809 scopus 로고    scopus 로고
    • Implementation of Overall Equipment Effectiveness (OEE) system at a semiconductor manufacturer
    • Austin, TX
    • GIEGLING, S., VERDINI, W. A., HAYMON, T. and KONOPKA, J. M., 1997, Implementation of Overall Equipment Effectiveness (OEE) system at a semiconductor manufacturer. Proceedings of 1997 IEMT Symposium, Austin, TX.
    • (1997) Proceedings of 1997 IEMT Symposium
    • Giegling, S.1    Verdini, W.A.2    Haymon, T.3    Konopka, J.M.4
  • 12
    • 0031078236 scopus 로고    scopus 로고
    • Closed-loop measurement of equipment efficiency and equipment capacity
    • LEACHMAN, R. C., 1997, Closed-loop measurement of equipment efficiency and equipment capacity. IEEE Transactions on Semiconductor Manufacturing, 10(1), 84-97.
    • (1997) IEEE Transactions on Semiconductor Manufacturing , vol.10 , Issue.1 , pp. 84-97
    • Leachman, R.C.1
  • 14
  • 15
    • 0032010663 scopus 로고    scopus 로고
    • Can overall factory effectiveness prolong Moore's Law?
    • SCOTT, D. and PISA, R., 1998, Can overall factory effectiveness prolong Moore's Law? Solid State Technology, 41(3), 75-82.
    • (1998) Solid State Technology , vol.41 , Issue.3 , pp. 75-82
    • Scott, D.1    Pisa, R.2
  • 16
    • 4243266712 scopus 로고    scopus 로고
    • Standard for definition and measurement of equipment productivity
    • SEMATECH, 1999, Standard for definition and measurement of equipment productivity. International SEMATECH, Report SEMI E79-299.
    • (1999) International SEMATECH, Report , vol.SEMI E79-299


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.