Can overall factory effectiveness prolong Moore's Law?

Solid State Technology

Volumn 41, Issue 3, 1998, Pages 75-82

  Scott, Douglas ^a,b   Pisa, Robert ^a  

^a Promis Systems Corp   (United States)

^b Promis Systems Corp   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

MICROPROCESSOR CHIPS; PRODUCTIVITY;

OVERALL EQUIPMENT EFFECTIVENESS (OEE); OVERALL FACTORY EFFECTIVENESS (OFE);

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0032010663     PISSN: 0038111X     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (8)

1. M. Iansiti, J. West, "The Evolving Challenge of Semiconductor Development," Harvard Business Review, May-June 1997.
2. M. Porter, "Operational Effectiveness is Not Strategy," Harvard Business Review, Nov.-Dec. 1996.
3. S. Myers, Solid State Technology, p. 105, Oct. 1997.
4. D. Martin, IBM Microelectronics, Advanced Semiconductor Mfg Conf., 1996.
5. Frank Robertson, I300I, Solid State Technology, p. 101, Oct. 1997.
6. S. Butler, et al., SEMATECH, "Sensor Based Process and Tool Control," Future Fab International, No. 2, Vol. 1.
7. J. Garbayo, "The seven deepest equipment integration pitfalls," Solid State Technology, p. 117, July 1997.
8. N. Stone, Harvard Business Review, July-Aug. 1997.