Electron irradiation-induced electro-migration and diffusion of defects in Mg-doped GaN

Physica Status Solidi (B) Basic Research

Volumn 239, Issue 2, 2003, Pages 310-315

  Gelhausen, O ^a   Klein, H N ^a,c   Phillips, M R ^a   Goldys, E M ^b  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^b MACQUARIE UNIVERSITY   (Australia)

^c TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142184711     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200301844     Document Type: Article

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