Low-Threshold Lasing and Purcell Effect in Microdisk Lasers at Room Temperature

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 9, Issue 5, 2003, Pages 1340-1346

  Baba, Toshihiko ^a   Sano, Daisuke ^a  

^a YOKOHAMA NATIONAL UNIVERSITY   (Japan)

Author keywords

GaInAsP InP; Lifetime measurement; Microdisk; Phase resolved spectroscopy; Purcell effect; Semiconductor laser; Spontaneous emission control; Surface recombination

Indexed keywords

ANISOTROPY; BANDPASS FILTERS; CARRIER CONCENTRATION; CURVE FITTING; DIFFRACTION; EPITAXIAL GROWTH; POLARIZATION; PUMPING (LASER); RELAXATION PROCESSES; SEMICONDUCTING GALLIUM;

GAINASP/INP; LIFETIME MEASUREMENT; MICRODISKS; PHASE-RESOLVED SPECTROSCOPY; PURCELL EFFECT; SPONTANEOUS EMISSION CONTROL; SURFACE RECOMBINATION;

SEMICONDUCTOR LASERS;

EID: 0142169159     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2003.819464     Document Type: Conference Paper

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