|
Volumn 36, Issue 9, 2000, Pages 790-791
|
Continuous wave lasing in GaInAsP microdisk injection laser with threshold current of 40μA
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CONTINUOUS WAVE LASERS;
ELECTRIC CURRENTS;
ELECTRON BEAMS;
ELECTRON CYCLOTRON RESONANCE;
PLASMA ETCHING;
PRESSURE EFFECTS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR QUANTUM WELLS;
TEMPERATURE;
CONTINUOUS WAVE LASING;
GALLIUM INDIUM ARSENIUM PHOSPHIDE;
INDUCTIVELY COUPLED PLASMA ETCHING;
MICRODISK INJECTION LASER;
RATE EQUATION ANALYSIS;
THRESHOLD CURRENT;
INJECTION LASERS;
|
EID: 0033734525
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20000609 Document Type: Article |
Times cited : (179)
|
References (5)
|