Study on improving damage threshold of dielectric films

Zhongguo Jiguang/Chinese Journal of Lasers

Volumn 30, Issue 7, 2003, Pages 637-641

  Liu, Qiang ^a   Lin, Li Bin ^a   Jiang, Xiao Dong ^b   Huang, Zu Xing ^b   Gan, Rong Bing ^a   Tang, Fang Yuan ^a  

^a SICHUAN UNIVERSITY   (China)

^b RESEARCH CENTER OF LASER FUSION   (China)

Author keywords

Cleaning; Coating; Damage threshold; Recontamination; Thin film physics

Indexed keywords

CLEANING; COATING TECHNIQUES; DIELECTRIC FILMS; PHYSICS;

DAMAGE THRESHOLD; RECONTAMINATION; THIN FILM PHYSICS;

THIN FILMS;

EID: 0142168011     PISSN: 02587025     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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