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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2714, Issue , 1996, Pages 316-330

Review of structural influences on the laser damage thresholds of oxide coatings

(3) Hacker, Erich J a Lauth, Hans a Weissbrodt, Peter a

a JENOPTIK Laser Optik Systeme GmbH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL PROPERTIES; COATING TECHNIQUES; COATINGS; CRYSTALLOGRAPHY; LASER DAMAGE; LASERS; MICROSTRUCTURE; MINERALOGY; OPTICAL COATINGS; OPTICAL MATERIALS; PROTECTIVE COATINGS; THERMAL SPRAYING;

BULK MATERIALS; CHEMICAL COMPOSITIONS; CHEMICAL STRUCTURES; DAMAGE RESISTANCES; DAMAGE THRESHOLDS; DEPOSITION CONDITIONS; FILM PROPERTIES; NEAR INFRARED; OXIDE COATINGS; STRUCTURAL INFLUENCES; ULTRA VIOLETS;

STRUCTURAL PROPERTIES;

EID: 57849163690 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.240376 Document Type: Conference Paper

Times cited : (34)

References (72)

1
- 0003637638
- Adam Hilger
- R. Wood, Laser Damage in Optical Materials, Adam Hilger,( 1986)
- (1986) Laser Damage in Optical Materials
- Wood, R.¹

2
- 0022883252
- C. K. Carniglia, SPIE 652 (1986), 202.
- (1986) SPIE , vol.652 , pp. 202
- Carniglia, C.K.¹

3
- 0020949807
- A. H. Guenther and T. W. Humpherys, SPIE 401 (1983), 247.
- (1983) SPIE , vol.401 , pp. 247
- Guenther, A.H.¹ Humpherys, T.W.²

4
- 57849126545
- H. E. Bennett, A.J. Glass, A.H. Guenther and B. Newnam, Appl. Opt. 19 (1980), 2347.
- (1980) Appl. Opt , vol.19 , pp. 2347
- Bennett, H.E.¹ Glass, A.J.² Guenther, A.H.³ Newnam, B.⁴

5
- 0020847646
- A. F. Stewart and A.H. Guenther, Appl. Opt. 23 (1984), 3774.
- (1984) Appl. Opt , vol.23 , pp. 3774
- Stewart, A.F.¹ Guenther, A.H.²

6
- 0021597350
- S. R. Foltyn, NBS Spec. Pub. 669 (1984), 368.
- (1984) NBS Spec. Pub , Issue.368 , pp. 669
- Foltyn, S.R.¹

7
- 0017219916
- J. R. Betties, R.A. House and A.H. Guenther, NBS Spec. Pub. 462 (1976), 338.
- (1976) NBS Spec. Pub , Issue.338 , pp. 462
- Betties, J.R.¹ House, R.A.² Guenther, A.H.³

8
- 0021600397
- A. Schmid, D. Smith, M. Guardalla and J. Abate, SPIE 476 (1984), 136.
- (1984) SPIE , vol.476 , pp. 136
- Schmid, A.¹ Smith, D.² Guardalla, M.³ Abate, J.⁴

9
- 0022752730
- R. Wolf, G. Zscherpe, E. Welsch, V. Göpner and D. Schäfer, Optica Acta, 33 (1986), 919.
- (1986) Optica Acta , vol.33 , pp. 919
- Wolf, R.¹ Zscherpe, G.² Welsch, E.³ Göpner, V.⁴ Schäfer, D.⁵

10
- 57849151442
- M. Küster and J. Ebert, NBS Spec. Pub. 568 (1979), 269.
- (1979) NBS Spec. Pub , Issue.269 , pp. 568
- Küster, M.¹ Ebert, J.²

11
- 57849112129
- S.D. Jacobs, LLE Review 10 (1982), 3.
- (1982) LLE Review , vol.10 , pp. 3
- Jacobs, S.D.¹

12
- 84918623465
- G.J. Exarhos, W.S. Frydrych, K.F. Ferris and N.J. Hess, NIST Spec. Publ. 756 (1988), 352.
- (1988) NIST Spec. Publ , vol.756 , pp. 352
- Exarhos, G.J.¹ Frydrych, W.S.² Ferris, K.F.³ Hess, N.J.⁴

13
- 57849135899
- G. J. Exarhos and D.M.Friedrich, Microbeam Analysis, (1987), 147.
- (1987) Microbeam Analysis , pp. 147
- Exarhos, G.J.¹ Friedrich, D.M.²

14
- 0005213372
- K. Yoshida, T. Yabe, H. Yoshida and C. Yamanaka, J. Appl. Phys. 60 (1986), 1545.
- (1986) J. Appl. Phys , vol.60 , pp. 1545
- Yoshida, K.¹ Yabe, T.² Yoshida, H.³ Yamanaka, C.⁴

15
- 84918612651
- J. R. Palmer, SPIE 655 (1986), 656.
- (1986) SPIE , vol.655 , pp. 656
- Palmer, J.R.¹

16
- 0020780064
- J. R. Palmer, Optical Engineering, 22 (1983), 435.
- (1983) Optical Engineering , vol.22 , pp. 435
- Palmer, J.R.¹

17
- 57849091548
- M. R. Lange, J. K. McIver and A. H. Guenther, Thin Solid Films 125 (1985), 435.
- (1985) Thin Solid Films , vol.125 , pp. 435
- Lange, M.R.¹ McIver, J.K.² Guenther, A.H.³

18
- 0025516801
- E. Hacker, H. Lauth, J. Meyer, P. Weißbrodt, R. Wolf, G. Zscherpe and H. Heyer, Thin Solid Films, 192 (1990), 27.
- (1990) Thin Solid Films , vol.192 , pp. 27
- Hacker, E.¹ Lauth, H.² Meyer, J.³ Weißbrodt, P.⁴ Wolf, R.⁵ Zscherpe, G.⁶ Heyer, H.⁷

19
- 57849163903
- W. T. Pawlewicz. R. Busch, D. D. Hays, P.M. Martin and N. Laegreid, NBS Spec. Publ. 568 (1980), 359.
- (1980) NBS Spec. Publ , vol.568 , pp. 359
- Pawlewicz, W.T.¹ Busch, R.² Hays, D.D.³ Martin, P.M.⁴ Laegreid, N.⁵

20
- 57849096937
- Dissertation Universität Jena
- E. Hacker, Dissertation Universität Jena (1983).
- (1983)
- Hacker, E.¹

21
- 25144448670
- J. H. Apfel, Thin Solid Films 73 (1980), 167.
- (1980) Thin Solid Films , vol.73 , pp. 167
- Apfel, J.H.¹

22
- 0018491770
- S. S. C.Babu, IEEE J. Quant. Electr. Lett. QE-17, 7 (1979), 533.
- S. S. C.Babu, IEEE J. Quant. Electr. Lett. QE-17, 7 (1979), 533.

23
- 0020128588
- T. A. Wiggins and R.S. Reid, Appl. Opt. 21 (1982), 1675.
- (1982) Appl. Opt , vol.21 , pp. 1675
- Wiggins, T.A.¹ Reid, R.S.²

24
- 0015614409
- N. Bloembergen, Appl. Opt., 12 (1973), 661.
- (1973) Appl. Opt , vol.12 , pp. 661
- Bloembergen, N.¹

25
- 0020194261
- D. Milam, W. H. Lowdermilk, F. Rainer, J. E. Swain, C. K. Carniglia and T. Tuttle Hart, Appl. Opt. 21(1982), 3689.
- (1982) Appl. Opt , vol.21 , pp. 3689
- Milam, D.¹ Lowdermilk, W.H.² Rainer, F.³ Swain, J.E.⁴ Carniglia, C.K.⁵ Tuttle Hart, T.⁶

26
- 57849088050
- D. Ristau, J. Ebert und H. Welling, Laser und Optoelektronik, 21(1989), 48.
- (1989) Laser und Optoelektronik , vol.21 , pp. 48
- Ristau, D.¹ Ebert, J.² Welling, H.³

27
- 30144432778
- T. Tuttle Hart, T. L. Lichtenstein, C. K. Carniglia and F. Rainer, NBS Spec. Publ. 638 (1981), 344.
- (1981) NBS Spec. Publ , vol.638 , pp. 344
- Tuttle Hart, T.¹ Lichtenstein, T.L.² Carniglia, C.K.³ Rainer, F.⁴

28
- 1942524628
- M. E. Frink, J. W. Arenberg, P. W. Mordaut and S. C. Seitel, Appl. Phys. Lett. 51(1987), 415.
- (1987) Appl. Phys. Lett , vol.51 , pp. 415
- Frink, M.E.¹ Arenberg, J.W.² Mordaut, P.W.³ Seitel, S.C.⁴

29
- 0020847391
- J. A. Kardach, A. F. Stewart and A. H. Guenther, Appl. Opt. 23 (1984), 3817.
- (1984) Appl. Opt , vol.23 , pp. 3817
- Kardach, J.A.¹ Stewart, A.F.² Guenther, A.H.³

30
- 57849119082
- Laser und Optoelektronik
- E. Hacker, H. Lauth, P. Weißbrodt und R. Wolf, Laser und Optoelektronik, Jahrgang 22, 5 (1990), 50.
- (1990) Jahrgang , vol.22 , Issue.5 , pp. 50
- Hacker, E.¹ Lauth, H.² Weißbrodt, P.³ Wolf, R.⁴

31
- 57849118182
- A. Smakula, DRP 685 767 (1935).
- (1935) , vol.DRP 685 , Issue.767
- Smakula, A.¹

32
- 84956097285
- G. Fehlau, E. Hacker, H. Lauth und R. Wolf, Potsdamer Forschungen, Reihe B, 44 (1984), 95.
- (1984) Potsdamer Forschungen, Reihe B , vol.44 , pp. 95
- Fehlau, G.¹ Hacker, E.² Lauth, H.³ Wolf, R.⁴

33
- 49049152079
- H. Fischer, E. Hacker and G. Schirmer, Thin Solid Films, 85 (1981), 343.
- (1981) Thin Solid Films , vol.85 , pp. 343
- Fischer, H.¹ Hacker, E.² Schirmer, G.³

34
- 0019615541
- S. Schiller, G. Beister, W. Sieber, G. Schirmer and E. Hacker, Thin Solid Films, 83 (1981), 239.
- (1981) Thin Solid Films , vol.83 , pp. 239
- Schiller, S.¹ Beister, G.² Sieber, W.³ Schirmer, G.⁴ Hacker, E.⁵

35
- 57849100398
- P. Weißbrodt, L. Raupach, N. Melcher, E. Hacker, H. Lauth und D. Schäfer, Proceedings 6. Tagung Festkörperanalytik, Chemnitz, 12.-15.06.1990.
- P. Weißbrodt, L. Raupach, N. Melcher, E. Hacker, H. Lauth und D. Schäfer, Proceedings 6. Tagung "Festkörperanalytik", Chemnitz, 12.-15.06.1990.

36
- 57849094828
- Patent DE 3 430 580, CH 665 292, DD 230 561 (1983).
- Patent DE 3 430 580, CH 665 292, DD 230 561 (1983).

37
- 34948877582
- A. Duparré, E. Welsch, H.-G. Walther, N. Kaiser, H. Müller, E. Hacker, H. Lauth, J. Meyer, and P. Weißbrodt, Thin Solid Films, 187 (1990), 275.
- (1990) Thin Solid Films , vol.187 , pp. 275
- Duparré, A.¹ Welsch, E.² Walther, H.-G.³ Kaiser, N.⁴ Müller, H.⁵ Hacker, E.⁶ Lauth, H.⁷ Meyer, J.⁸ Weißbrodt, P.⁹

38
- 0005949646
- I. J. Strong, J. Opt Soc. Am., 26 (1936), 73.
- (1936) J. Opt Soc. Am , vol.26 , pp. 73
- Strong, I.J.¹

39
- 57849166087
- Dissertation B, Techn. Universität Chemnitz
- R. Wolf, Dissertation B, Techn. Universität Chemnitz, (1987).
- (1987)
- Wolf, R.¹

40
- 25644435898
- T.W. Walker, A. Vaidyanathan, A.H. Guenther and P. Nielsen, NBS Spec. Publ., 568 (1980), 479 2041.
- (1980) NBS Spec. Publ , vol.568 , pp. 479-2041
- Walker, T.W.¹ Vaidyanathan, A.² Guenther, A.H.³ Nielsen, P.⁴

41
- 57849119501
- K.F. Ferris, G.J. Exarhos and C. Nguyen, NIST Spec. Publ. 752 (1988), 272.
- (1988) NIST Spec. Publ , vol.752 , pp. 272
- Ferris, K.F.¹ Exarhos, G.J.² Nguyen, C.³

42
- 0023963564
- R. Iscoff, Lasers & Optronics, 2 (1988), 53.
- (1988) Lasers & Optronics , vol.2 , pp. 53
- Iscoff, R.¹

43
- 0020843148
- K.H. Guenther, T.W. Humpherys, J. Balmer, J.R. Betties, E. Casparis, J. Ebert, M. Eichner, A. H. Guenther, E. Kiesel, R. Kuehnel, D. Milam, W. Ryseck, S.C. Seitel, A.F. Stewart, H. Weber, H.P. Weber, G.R. Wirtenson and R.M. Wood, Appl. Opt., 23 (1984), 3743.
- (1984) Appl. Opt , vol.23 , pp. 3743
- Guenther, K.H.¹ Humpherys, T.W.² Balmer, J.³ Betties, J.R.⁴ Casparis, E.⁵ Ebert, J.⁶ Eichner, M.⁷ Guenther, A.H.⁸ Kiesel, E.⁹ Kuehnel, R.¹⁰ Milam, D.¹¹ Ryseck, W.¹² Seitel, S.C.¹³ Stewart, A.F.¹⁴ Weber, H.¹⁵ Weber, H.P.¹⁶ Wirtenson, G.R.¹⁷ Wood, R.M.¹⁸

44
- 57849103791
- S. Joachim, P. Weißbrodt, E. Hacker, H. Lauth, N. Melcher und L. Raupach, Beiträge zur Optik und Quantenelektronik, 15 (1990), 152.
- (1990) Beiträge zur Optik und Quantenelektronik , vol.15 , pp. 152
- Joachim, S.¹ Weißbrodt, P.² Hacker, E.³ Lauth, H.⁴ Melcher, N.⁵ Raupach, L.⁶

45
- 0028754066
- M. R. Kozlowski, R. Chow, Proc. SPIE Vol. 2114 (1993), 640.
- (1993) Proc. SPIE , vol.2114 , pp. 640
- Kozlowski, M.R.¹ Chow, R.²

46
- 3042969303
- K. Mann, H. Gerhardt, G. Pfeifer, R. Wolf, Proc. SPIE Vol. 1624 (1991), 436.
- (1991) Proc. SPIE , vol.1624 , pp. 436
- Mann, K.¹ Gerhardt, H.² Pfeifer, G.³ Wolf, R.⁴

47
- 0027804683
- T. Izawa, N. Yamamura, R. Uchimura, S. Kimura, T. Yakuoh, Proc. SPIE Vol. 1848 (1992), 322.
- (1992) Proc. SPIE , vol.1848 , pp. 322
- Izawa, T.¹ Yamamura, N.² Uchimura, R.³ Kimura, S.⁴ Yakuoh, T.⁵

48
- 0029513972
- R. Krupka, K. Jasper, A. Giesen, Proc. SPIE Vol. 2428 (1994), 101.
- (1994) Proc. SPIE , vol.2428 , pp. 101
- Krupka, R.¹ Jasper, K.² Giesen, A.³

49
- 0027871533
- R. Chow, S. Falabella, G. E. Loomis, F. Rainer, C. J. Stolz, M. R. Kozlowski, Proc. SPIE Vol. 1848 (1992), 349.
- (1992) Proc. SPIE , vol.1848 , pp. 349
- Chow, R.¹ Falabella, S.² Loomis, G.E.³ Rainer, F.⁴ Stolz, C.J.⁵ Kozlowski, M.R.⁶

50
- 0028754430
- N. Kaiser, H. Uhlig, U. Schallenberg, B. Anton, U. Kaiser, K. Mann, E. Eva, Proc. SPIE Vol. 2114 (1993), 325.
- (1993) Proc. SPIE , vol.2114 , pp. 325
- Kaiser, N.¹ Uhlig, H.² Schallenberg, U.³ Anton, B.⁴ Kaiser, U.⁵ Mann, K.⁶ Eva, E.⁷

51
- 0028757261
- A. Bodemann, M. Reichling, N. Kaiser, E. Welsch, Proc. SPIE Vol. 2114 (1993), 405.
- (1993) Proc. SPIE , vol.2114 , pp. 405
- Bodemann, A.¹ Reichling, M.² Kaiser, N.³ Welsch, E.⁴

52
- 57849111659
- F.L. Williams, G.A. Petersen, R.A. Schmell, C.K. Carniglia, Proc. SPIE Vol. 1624 (1991), 256.
- (1991) Proc. SPIE , vol.1624 , pp. 256
- Williams, F.L.¹ Petersen, G.A.² Schmell, R.A.³ Carniglia, C.K.⁴

53
- 0028732523
- F. E. Hovis, B. A. Shepherd, C. T. Radcliffe, A. L.Bailey, W.T. Boswell, Proc. SPIE Vol. 2114 (1993), 145.
- (1993) Proc. SPIE , vol.2114 , pp. 145
- Hovis, F.E.¹ Shepherd, B.A.² Radcliffe, C.T.³ Bailey, A.L.⁴ Boswell, W.T.⁵

54
- 0038501498
- T.J. Magee, C.S. Leung, F.D. Orazio, J.D. Boyer, B.R. Mauro, V.E. Sanders, Proc. SPIE Vol. 1438, 230.
- Proc. SPIE , vol.1438 , pp. 230
- Magee, T.J.¹ Leung, C.S.² Orazio, F.D.³ Boyer, J.D.⁴ Mauro, B.R.⁵ Sanders, V.E.⁶

55
- 0028735177
- I. A. Bubnov, O. M. Efimov, L. B. Glebov, N. N. Nikonorov, V.S. Popikov, Proc. SPIE Vol. 2114 (1993), 178.
- (1993) Proc. SPIE , vol.2114 , pp. 178
- Bubnov, I.A.¹ Efimov, O.M.² Glebov, L.B.³ Nikonorov, N.N.⁴ Popikov, V.S.⁵

56
- 0028742087
- T. Izawa, N. Yamamura, R. Uchimura, T. Yakuoh, Proc. SPIE Vol. 2114 (1993), 297.
- (1993) Proc. SPIE , vol.2114 , pp. 297
- Izawa, T.¹ Yamamura, N.² Uchimura, R.³ Yakuoh, T.⁴

57
- 57849134040
- N.V. Morozov, S.I. Sagitov, V.S. Barabanov, Proc. SPIE Vol. 2428 (1994), 124.
- (1994) Proc. SPIE , vol.2428 , pp. 124
- Morozov, N.V.¹ Sagitov, S.I.² Barabanov, V.S.³

58
- 0000897804
- N. Kaiser, B. Anton, J. Jänchen, K. Mann, E. Eva, C. Fischer, R. Henking, D. Ristau, P. Weissbrodt, D. Mademann, L. Raupach, E. Hacker, Proc. SPIE Vol. 2428 (1994), 400.
- (1994) Proc. SPIE , vol.2428 , pp. 400
- Kaiser, N.¹ Anton, B.² Jänchen, J.³ Mann, K.⁴ Eva, E.⁵ Fischer, C.⁶ Henking, R.⁷ Ristau, D.⁸ Weissbrodt, P.⁹ Mademann, D.¹⁰ Raupach, L.¹¹ Hacker, E.¹²

59
- 1542541112
- M. R. Kozlowski, M. Staggs, F. Reiner, J. H. Stathis, Proc. SPIE Vol. 1441 (1990), 269.
- (1990) Proc. SPIE , vol.1441 , pp. 269
- Kozlowski, M.R.¹ Staggs, M.² Reiner, F.³ Stathis, J.H.⁴

60
- 0027866092
- M. Rahe, D. Ristau, H. Schmidt, Proc. SPIE Vol. 1848 (1992), 335.
- (1992) Proc. SPIE , vol.1848 , pp. 335
- Rahe, M.¹ Ristau, D.² Schmidt, H.³

61
- 0028752285
- S. Guch, F. E. Hovis, Proc. SPIE Vol. 2114 (1993), 505.
- (1993) Proc. SPIE , vol.2114 , pp. 505
- Guch, S.¹ Hovis, F.E.²

62
- 0027805250
- I.M. Thomas, Proc. SPIE Vol. 1848 (1992), 281.
- (1992) Proc. SPIE , vol.1848 , pp. 281
- Thomas, I.M.¹

63
- 0029534268
- K. L. Lewis, J. Simpson, J. R. Milward, Proc. SPIE Vol. 2428 (1994), 370.
- (1994) Proc. SPIE , vol.2428 , pp. 370
- Lewis, K.L.¹ Simpson, J.² Milward, J.R.³

64
- 0009599699
- VEB Deutscher Verlag für Grundstoffindustrie, Leipzig
- H. Duncken, Physikalische Chemie der Glasoberfläche, VEB Deutscher Verlag für Grundstoffindustrie, Leipzig, (1981)
- (1981) Physikalische Chemie der Glasoberfläche
- Duncken, H.¹

65
- 0025814286
- R. Crase, Proc. SPIE Vol. 1441 (1990), 381.
- (1990) Proc. SPIE , vol.1441 , pp. 381
- Crase, R.¹

66
- 0028735177
- I.A. Bubnov, O.M. Efimov, L.B. Glebov, N.N. Nikonorov, V.S. Popikov, Proc. SPIE Vol. 2114 (1993), 178.
- (1993) Proc. SPIE , vol.2114 , pp. 178
- Bubnov, I.A.¹ Efimov, O.M.² Glebov, L.B.³ Nikonorov, N.N.⁴ Popikov, V.S.⁵

67
- 57849153326
- A. Bernhardt, A. Starke, Proc. SPIE Vol. 1624 (1991), 211.
- (1991) Proc. SPIE , vol.1624 , pp. 211
- Bernhardt, A.¹ Starke, A.²

68
- 0342407126
- J. Kolbe, H. Kessler, T. Hofmann, F. Meyer, H. Schink, D. Ristau, Proc. SPIE Vol. 1624 (1991), 221.
- (1991) Proc. SPIE , vol.1624 , pp. 221
- Kolbe, J.¹ Kessler, H.² Hofmann, T.³ Meyer, F.⁴ Schink, H.⁵ Ristau, D.⁶

69
- 0028754425
- J. Becker, A. Bernhardt, Proc. SPIE Vol. 2114 (1993), 703.
- (1993) Proc. SPIE , vol.2114 , pp. 703
- Becker, J.¹ Bernhardt, A.²

70
- 0029513967
- J. W. Arenberg, Proc. SPIE Vol. 2428 (1994), 484.
- (1994) Proc. SPIE , vol.2428 , pp. 484
- Arenberg, J.W.¹

71
- 57849148836
- L. J. Shaw-Klein, S. D. Jacobs, S. J. Burns, J. C. Lambropoulos, Proc. SPIE Vol. 1624 (1991), 346.
- (1991) Proc. SPIE , vol.1624 , pp. 346
- Shaw-Klein, L.J.¹ Jacobs, S.D.² Burns, S.J.³ Lambropoulos, J.C.⁴

72
- 58149292515
- P. Weißbrodt, L. Raupach, E. Hacker, Proc.SPIE Vol. 2209(1994), 672.
- (1994) Proc.SPIE , vol.2209 , pp. 672
- Weißbrodt, P.¹ Raupach, L.² Hacker, E.³

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