Laser damage testing of SiO2 and HfO2 thin films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3738, Issue , 1999, Pages 337-346

  Giulio, M Di ^a   Alvisi, M ^a   Perrone, M R ^a   Protopapa, M L ^a   Valentini, A ^a   Vasanelli, L ^a  

^a UNIVERSITY OF SALENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; EVAPORATION; EXCIMER LASERS; FUSED SILICA; HAFNIUM COMPOUNDS; LASER DAMAGE; LASER OPTICS; PHOTOACOUSTIC EFFECT; SUBSTRATES; THIN FILMS;

HAFNIA; PHOTOACOUSTIC DEFLECTION;

OPTICAL FILMS;

EID: 0032641111     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (14)