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Volumn 95, Issue 2, 2003, Pages 276-286
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Reconstruction of the Characteristics and Determination of the Parameters of a Statistical Surface Roughness from Light Scattering Data in an Integrated Waveguide in the Presence of Noise
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Author keywords
[No Author keywords available]
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Indexed keywords
CORRELATION METHODS;
OPTICAL WAVEGUIDES;
QUANTUM OPTICS;
SIGNAL TO NOISE RATIO;
SURFACE ROUGHNESS;
WHITE NOISE;
LASER RADIATION;
LIGHT SCATTERING;
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EID: 0142125383
PISSN: 0030400X
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1604436 Document Type: Article |
Times cited : (6)
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References (23)
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