메뉴 건너뛰기




Volumn 95, Issue 2, 2003, Pages 276-286

Reconstruction of the Characteristics and Determination of the Parameters of a Statistical Surface Roughness from Light Scattering Data in an Integrated Waveguide in the Presence of Noise

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; OPTICAL WAVEGUIDES; QUANTUM OPTICS; SIGNAL TO NOISE RATIO; SURFACE ROUGHNESS; WHITE NOISE;

EID: 0142125383     PISSN: 0030400X     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1604436     Document Type: Article
Times cited : (6)

References (23)
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.