The use of waveguide scattering of laser radiation for measuring the autocorrelation function of the statistical roughness of a surface in a broad range of variation of roughness correlation

Kvantovaya Elektronika

Volumn 32, Issue 4, 2002, Pages 357-362

  Egorov, A A ^a  

^a NONE

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EID: 0036419805     PISSN: 03687147     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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