Retrieval of characteristics and determination of parameters of a statistical nanometer-scale surface roughness by the light scattering data in a planar optical waveguide in the presence of additive noise

Izvestiya Vysshikh Uchebnykh Zavedenij. Radiofizika

Volumn 45, Issue 7, 2002, Pages 577-585

  Egorov, A A ^a  

^a NONE

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EID: 0036423101     PISSN: 00213462     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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