Reconstruction of characteristics and determination of parameters of statistical nanometer-scale surface roughness using the data on scattering in a planar optical waveguide

Izvestiya Vysshikh Uchebnykh Zavedenij. Radiofizika

Volumn 43, Issue 12, 2000, Pages 1090-1100

  Egorov, A A ^a  

^a NONE

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EID: 0034587468     PISSN: 00213462     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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