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Volumn 83, Issue 11, 2003, Pages 2157-2159
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Micropipe evolution in silicon carbide
e
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL GROWTH;
STRESS ANALYSIS;
SYNCHROTRON RADIATION;
X RAY DIFFRACTION;
DIPOLES;
SILICON CARBIDE;
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EID: 0142121620
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1609038 Document Type: Article |
Times cited : (16)
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References (16)
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