-
1
-
-
0036788249
-
Broadband measurement of ESD risetimes to distinguish between different discharge mechanisms
-
S. Bönisch, D. Pommerenke, W. Kalkner: "Broadband Measurement of ESD Risetimes to Distinguish between Different Discharge Mechanisms", Journal of Electrostatics, Vol. 56, No. 3, 2002, pp. 363-383
-
(2002)
Journal of Electrostatics
, vol.56
, Issue.3
, pp. 363-383
-
-
Bönisch, S.1
Pommerenke, D.2
Kalkner, W.3
-
2
-
-
4243498384
-
Einfluß von Annäherungsgeschwindigkeit, Elektrodenmaterial und Luftfeuchtigkeit auf elektrostatische Entladungen (ESD) bei kleinen Abständen und Spannungen
-
(german only)
-
S. Bönisch, W. Kalkner: "Einfluß von Annäherungsgeschwindigkeit, Elektrodenmaterial und Luftfeuchtigkeit auf elektrostatische Entladungen (ESD) bei kleinen Abständen und Spannungen", EMV 2002 - Internationale Fachmesse und Kongreß für Elektromagnetische Verträglichkeit, Düsseldorf, 2002, 101-108 (german only)
-
EMV 2002 - Internationale Fachmesse und Kongreß für Elektromagnetische Verträglichkeit, Düsseldorf, 2002
, pp. 101-108
-
-
Bönisch, S.1
Kalkner, W.2
-
3
-
-
35348915404
-
Influence of the approach speed, charge voltage and electrode material on the intensity and reproducibility of short gap electrostatic discharges
-
S. Bönisch, W. Kalkner: "Influence of the approach speed, charge voltage and electrode material on the intensity and reproducibility of short gap electrostatic discharges", EMC Zurich 2003, 15th International Zurich Symposium on Electromagnetic Compatibility, Zurich, 2003, pp. 677-682
-
EMC Zurich 2003, 15th International Zurich Symposium on Electromagnetic Compatibility, Zurich, 2003
, pp. 677-682
-
-
Bönisch, S.1
Kalkner, W.2
-
4
-
-
0026925280
-
New field-emitter switch for ESD protection of microwave circuits
-
K. Bock, H. L. Hartnagel: "New Field-Emitter Switch for ESD Protection of Microwave Circuits", Electronics Letters, Vol 28, No. 19, 1992, pp. 1822-1824
-
(1992)
Electronics Letters
, vol.28
, Issue.19
, pp. 1822-1824
-
-
Bock, K.1
Hartnagel, H.L.2
-
5
-
-
0141932904
-
Properties of GaAs field emitter array structures for ESD-protection of MMIC
-
K. Bock, H. L. Hartnagel: "Properties of GaAs Field Emitter Array Structures for ESD-Protection of MMIC"
-
-
-
Bock, K.1
Hartnagel, H.L.2
-
6
-
-
0141932907
-
Feldemissionsstrukturen für ESD-Schutzschaltungen im Mikrowellenbereich
-
ISBN 3-9802845-0-6 (german only)
-
K. Bock, H. L. Hartnagel: "Feldemissionsstrukturen für ESD-Schutzschaltungen im Mikrowellenbereich", Tagungsband 2. ESD-Forum, Neuss, 1991, pp. 134-143, ISBN 3-9802845-0-6 (german only)
-
Tagungsband 2. ESD-Forum, Neuss, 1991
, pp. 134-143
-
-
Bock, K.1
Hartnagel, H.L.2
-
7
-
-
0035784893
-
Emission characteristics of gallium arsenide wedge emitter monolithically fabricated with an air bridge and a cantilever anode
-
H. Mimura, O. Yyilmazoglu, H. Shimawaki, K. Yokoo, K. Mutamba, H. Hartnagel: "Emission characteristics of gallium arsenide wedge emitter monolithically fabricated with an air bridge and a cantilever anode", Proc. of 14th Int. Vacuum Microelectronics Conference, 2001, pp. 129-130
-
Proc. of 14th Int. Vacuum Microelectronics Conference, 2001
, pp. 129-130
-
-
Mimura, H.1
Yyilmazoglu, O.2
Shimawaki, H.3
Yokoo, K.4
Mutamba, K.5
Hartnagel, H.6
-
8
-
-
0141898476
-
High field breakdown characteristics of micrometric gaps in vacuum
-
Xianyuan Ma, T. S. Sudarshan: "High field breakdown characteristics of micrometric gaps in vacuum", J. Vac. Sci. Technol. B, Vol 16, No. 2, 1998, pp. 745-748
-
(1998)
J. Vac. Sci. Technol. B
, vol.16
, Issue.2
, pp. 745-748
-
-
Ma, X.1
Sudarshan, T.S.2
-
9
-
-
0019916138
-
Voltage breakdown between closely spaced electrodes over polymeric insulator surfaces in air
-
E. W. Gray, D. J. Harrington: "Voltage breakdown between closely spaced electrodes over polymeric insulator surfaces in air", J. Appl. Phys., Vol 53, No. 1, 1982, pp. 237-244
-
(1982)
J. Appl. Phys.
, vol.53
, Issue.1
, pp. 237-244
-
-
Gray, E.W.1
Harrington, D.J.2
-
10
-
-
0001492553
-
High field breakdown of narrow quasi uniform field gaps in vacuum
-
P. G. Muzykov, Xianyuan Ma, D. I. Cherednichenko, T. S. Sudarshan: "High field breakdown of narrow quasi uniform field gaps in vacuum", J. Appl. Phys., Vol 85 No. 12, 1999, pp. 8400-8404
-
(1999)
J. Appl. Phys.
, vol.85
, Issue.12
, pp. 8400-8404
-
-
Muzykov, P.G.1
Ma, X.2
Cherednichenko, D.I.3
Sudarshan, T.S.4
-
11
-
-
4243764908
-
Spark gap modeling
-
Intusoft Newsletter Issue #50, Sinard, France
-
C. Basso: "Spark Gap Modeling", Intusoft Newsletter Issue #50, Sinard, France
-
-
-
Basso, C.1
-
12
-
-
0026402543
-
A SPICE model for simulating arc discharge loads
-
M. Narui, F. P. Dawson, "A SPICE Model for Simulating Arc Discharge Loads", IEEE Industry Applications Society Annual Meeting, Vol. II, 1991, pp. 1476-1482
-
(1991)
IEEE Industry Applications Society Annual Meeting
, vol.2
, pp. 1476-1482
-
-
Narui, M.1
Dawson, F.P.2
-
13
-
-
0033336348
-
A SPICE compatible model of high intensity discharge lamps
-
M. Shvartsas, S. Ben-Yaakov: "A SPICE Compatible Model of High Intensity Discharge Lamps", IEEE Power Electronics Specialists Conference, PESC-99, Charleston, 1999, pp. 1037-1042
-
IEEE Power Electronics Specialists Conference, PESC-99, Charleston, 1999
, pp. 1037-1042
-
-
Shvartsas, M.1
Ben-Yaakov, S.2
-
14
-
-
0029486581
-
A PSpice model for fluorescent lamps operated at high frequencies
-
T.-F. Wu, J.-C. Hung, T.-H. Yu: "A PSpice Model for Fluorescent Lamps Operated at High Frequencies," IEEE Int. Conf. on Industrial Electronics, Control, and Instrumentation, Vol. 1, 1995, pp. 359-364
-
(1995)
IEEE Int. Conf. on Industrial Electronics, Control, and Instrumentation
, vol.1
, pp. 359-364
-
-
Wu, T.-F.1
Hung, J.-C.2
Yu, T.-H.3
-
15
-
-
0031623657
-
A Pspice model for electrical characteristics of fluorescent lamps
-
T. Liu, K. J. Tseng, D. M. Veilathgamuwa: "A Pspice Model for Electrical Characteristics of Fluorescent Lamps", IEEE Conf. of Power Electronics Specialists, Vol. 2, 1998, pp. 1749-1754
-
(1998)
IEEE Conf. of Power Electronics Specialists
, vol.2
, pp. 1749-1754
-
-
Liu, T.1
Tseng, K.J.2
Veilathgamuwa, D.M.3
-
17
-
-
0010543965
-
Prüfung der Störfestigkeit gegen die Entladung statischer Elektrizität
-
Internationale Norm IEC 1000-4-2; VDE-Verlag
-
Internationale Norm IEC 1000-4-2: "Prüfung der Störfestigkeit gegen die Entladung statischer Elektrizität", VDE-Verlag, 1996
-
(1996)
-
-
|