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Volumn 1, Issue , 2003, Pages 37-42

Measurement and simulation of the behavior of a short spark gap used as ESD protection device

Author keywords

Electrostatic discharge; ESD; Protection device; PSPICE model; Short gap; Simulation; Surface process

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC DISCHARGES; ELECTRIC EQUIPMENT PROTECTION; ELECTRIC SPARK GAPS; ELECTROSTATICS; FREQUENCY RESPONSE; INSERTION LOSSES; MATHEMATICAL MODELS; SCATTERING PARAMETERS; VOLTAGE MEASUREMENT;

EID: 0141974776     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (17)
  • 1
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    • Broadband measurement of ESD risetimes to distinguish between different discharge mechanisms
    • S. Bönisch, D. Pommerenke, W. Kalkner: "Broadband Measurement of ESD Risetimes to Distinguish between Different Discharge Mechanisms", Journal of Electrostatics, Vol. 56, No. 3, 2002, pp. 363-383
    • (2002) Journal of Electrostatics , vol.56 , Issue.3 , pp. 363-383
    • Bönisch, S.1    Pommerenke, D.2    Kalkner, W.3
  • 4
    • 0026925280 scopus 로고
    • New field-emitter switch for ESD protection of microwave circuits
    • K. Bock, H. L. Hartnagel: "New Field-Emitter Switch for ESD Protection of Microwave Circuits", Electronics Letters, Vol 28, No. 19, 1992, pp. 1822-1824
    • (1992) Electronics Letters , vol.28 , Issue.19 , pp. 1822-1824
    • Bock, K.1    Hartnagel, H.L.2
  • 5
    • 0141932904 scopus 로고    scopus 로고
    • Properties of GaAs field emitter array structures for ESD-protection of MMIC
    • K. Bock, H. L. Hartnagel: "Properties of GaAs Field Emitter Array Structures for ESD-Protection of MMIC"
    • Bock, K.1    Hartnagel, H.L.2
  • 6
    • 0141932907 scopus 로고    scopus 로고
    • Feldemissionsstrukturen für ESD-Schutzschaltungen im Mikrowellenbereich
    • ISBN 3-9802845-0-6 (german only)
    • K. Bock, H. L. Hartnagel: "Feldemissionsstrukturen für ESD-Schutzschaltungen im Mikrowellenbereich", Tagungsband 2. ESD-Forum, Neuss, 1991, pp. 134-143, ISBN 3-9802845-0-6 (german only)
    • Tagungsband 2. ESD-Forum, Neuss, 1991 , pp. 134-143
    • Bock, K.1    Hartnagel, H.L.2
  • 8
    • 0141898476 scopus 로고    scopus 로고
    • High field breakdown characteristics of micrometric gaps in vacuum
    • Xianyuan Ma, T. S. Sudarshan: "High field breakdown characteristics of micrometric gaps in vacuum", J. Vac. Sci. Technol. B, Vol 16, No. 2, 1998, pp. 745-748
    • (1998) J. Vac. Sci. Technol. B , vol.16 , Issue.2 , pp. 745-748
    • Ma, X.1    Sudarshan, T.S.2
  • 9
    • 0019916138 scopus 로고
    • Voltage breakdown between closely spaced electrodes over polymeric insulator surfaces in air
    • E. W. Gray, D. J. Harrington: "Voltage breakdown between closely spaced electrodes over polymeric insulator surfaces in air", J. Appl. Phys., Vol 53, No. 1, 1982, pp. 237-244
    • (1982) J. Appl. Phys. , vol.53 , Issue.1 , pp. 237-244
    • Gray, E.W.1    Harrington, D.J.2
  • 10
    • 0001492553 scopus 로고    scopus 로고
    • High field breakdown of narrow quasi uniform field gaps in vacuum
    • P. G. Muzykov, Xianyuan Ma, D. I. Cherednichenko, T. S. Sudarshan: "High field breakdown of narrow quasi uniform field gaps in vacuum", J. Appl. Phys., Vol 85 No. 12, 1999, pp. 8400-8404
    • (1999) J. Appl. Phys. , vol.85 , Issue.12 , pp. 8400-8404
    • Muzykov, P.G.1    Ma, X.2    Cherednichenko, D.I.3    Sudarshan, T.S.4
  • 11
    • 4243764908 scopus 로고    scopus 로고
    • Spark gap modeling
    • Intusoft Newsletter Issue #50, Sinard, France
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    • Basso, C.1
  • 17
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    • Prüfung der Störfestigkeit gegen die Entladung statischer Elektrizität
    • Internationale Norm IEC 1000-4-2; VDE-Verlag
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    • (1996)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.