High field breakdown characteristics of micrometric gaps in vacuum

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 2, 1998, Pages 745-748

  Ma, Xianyun ^a   Sudarshan, T S ^a  

^a The Department of Mechanical Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0141898476     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589896     Document Type: Article

References (6)

1. H. C. Miller, IEEE Trans. Electr. Insul. 26, 949 (1991).
2. R. Latham, High Voltage Vacuum Insulation (Academic, London, 1995).
3. R. Hawley and A. Maitland, Vacuum as an Insulator (Chapman and Hall, London, 1967).
4. R. Hawley, Vacuum 18, 383 (1968).
5. Model 6512 Programmable Electrometer Instruction Manual, Keithley Instruments Inc., 1994.
6. X. Ma and T. S. Sudarshan, Conference on Electrical Insulation and Di-electric Phenomena, Minneapolis, Oct. 1997.