High-Resolution MFM: Simulation of Tip Sharpening

IEEE Transactions on Magnetics

Volumn 39, Issue 5 II, 2003, Pages 3447-3449

  Saito, Hitoshi ^a   Van den Bos, Arnout ^b   Abelmann, Leon ^b   Lodder, J Cock ^b  

^a AKITA UNIVERSITY   (Japan)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Magnetic force microscopy (MFM); Magnetic tips; Resolution; Simulation

Indexed keywords

COMPUTER SIMULATION; MAGNETIZATION; OPTICAL RESOLVING POWER; THERMAL NOISE;

MAGNETIC FORCE MICROSCOPY (MFM);

MAGNETIC DOMAINS;

EID: 0141952889     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2003.816178     Document Type: Article

References (11)

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