A time-of-flight mass spectrometric study of laser fluence dependencies in SnO2 ablation: Implications for pulsed laser deposited tin oxide thin films

International Journal of Mass Spectrometry

Volumn 230, Issue 1, 2003, Pages 11-17

  Fan, Haiyan ^a   Ho, Wei ^a   Reid, Scott A ^a  

^a Marquette University   (United States)

Author keywords

Ablation; Laser

Indexed keywords

METAL OXIDE; OXIDE; TIN;

ARTICLE; ENERGY; FILM; GAS; KINETICS; LASER; MASS SPECTROMETRY; STOICHIOMETRY; VACUUM;

EID: 0141927443     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-3806(03)00344-0     Document Type: Article

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