Direct topographic measurement of multilayers on water by atomic force microscopy

Langmuir

Volumn 19, Issue 20, 2003, Pages 8409-8415

  Dubreuil, Frédéric ^a,c   Daillant, Jean ^a,b   Guenoun, Patrick ^a  

^a SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

^b MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^c UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GOLD; INTERFACES (MATERIALS); INTERFEROMETRY; MULTILAYERS; NANOSTRUCTURED MATERIALS; NEUTRON SCATTERING; OPTICAL MICROSCOPY; POLYMERIZATION; SURFACE TOPOGRAPHY; VISCOSITY; X RAY SCATTERING;

DIRECT TOPOGRAPHIC MEASUREMENT; LANGMUIR MULTILAYERS; OCTADECYTRICHLOROSILANE;

LANGMUIR BLODGETT FILMS;

EID: 0141922768     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0343268     Document Type: Article

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