Approaching the liquid/air interface with scanning force microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1386-1389

  Eng, L M ^a   Seuret, Ch ^a   Looser, H ^a,b   Gunter P ^a  

^a ETH ZURICH   (Switzerland)

^b Department of Surgery   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5544251182     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589104     Document Type: Article

References (11)

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4. L. M. Eng, M. Küpfer, Ch. Seuret, M. Friedrich, and P. Günter, Helv. Phys. Acta 67, 757 (1994); L. M. Eng, M. Küpfer, Ch. Seuret, and P. Günter, Proceedings of the ECASIA '95, 6th European Conference Applied or Surface Interface Analysis, Oct. 9-13, 1995, Montreux, Switzerland (accepted).
5. D. Sarid, Scanning Force Microscopy, Oxford Series on Optical Sciences (Oxford University Press, Oxford, UK, 1991), p. 119.
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8. Ch. Seuret, L. Eng, H. Looser, and P. Günter (to be published).
9. F. Grünfeld, Rev. Sci. Instrum. 64, 528 (1993).
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11. J. P. Rabe, J. D. Swalen, and J. F. Rabolt, J. Chem. Phys. 86, 1601 (1987).