Advanced data analysis techniques for ion beam analysis

Surface and Interface Analysis

Volumn 35, Issue 9, 2003, Pages 760-769

  Barradas, N P ^a,b  

^a INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^b UNIVERSITY OF LISBON   (Portugal)

Author keywords

Artificial neural networks; Bayesian inference; RBS; Simulated annealing

Indexed keywords

ALGORITHMS; ANNEALING; COMPUTER SIMULATION; MARKOV PROCESSES; MONTE CARLO METHODS; NEURAL NETWORKS; SIMULATED ANNEALING; SURFACE REACTIONS; SURFACE ROUGHNESS;

BAYESIAN INFERENCE;

ION BEAMS;

EID: 0141889802     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1599     Document Type: Conference Paper

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