Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 161, Issue , 2000, Pages 287-292

  Jeynes, C ^a   Barradas, N P ^a,c   Wilde, J R ^b   Greer, A L ^b  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; COMPOSITE STRUCTURES; DATA REDUCTION; DATABASE SYSTEMS; ERRORS; NICKEL COMPOUNDS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SIMULATED ANNEALING;

BEAM ENERGY; ELASTIC BACKSCATTERING SPECTROMETRY; NON RUTHERFORD;

THICK FILMS;

EID: 0033891255     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00950-7     Document Type: Article

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