Algorithm to Extract Two-Node Bridges

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 11, Issue 4, 2003, Pages 741-744

  Zachariah, Sujit Thomas ^a   Chakravarty, Sreejit ^a  

^a INTEL CORPORATION   (United States)

Author keywords

Bridge; Defects; Extraction; Layout analysis

Indexed keywords

ALGORITHMS; CONSTRAINT THEORY; CRYSTAL DEFECTS; SEMICONDUCTOR DEVICE STRUCTURES;

TWO-NODE BRIDGES;

VLSI CIRCUITS;

EID: 0141862139     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2003.816141     Document Type: Article

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