Molecular alignments in sexiphenyl thin films epitaxially grown on muscovite

Thin Solid Films

Volumn 443, Issue 1-2, 2003, Pages 108-114

  Plank, H ^a   Resel, R ^a   Sitter, H ^b   Andreev, A ^b   Sariciftci, N S ^b   Hlawacek, G ^c   Teichert, C ^c   Thierry, A ^d   Lotz, B ^d  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^c UNIVERSITY OF LEOBEN   (Austria)

^d INSTITUT CHARLES SADRON   (France)

Author keywords

Electron diffraction; Epitaxy; Grain boundary; Organic semiconductors

Indexed keywords

ELECTRON DIFFRACTION; EPITAXIAL GROWTH; GRAIN BOUNDARIES; MICA; MOLECULAR ORIENTATION; NANOSTRUCTURED MATERIALS; SEMICONDUCTING ORGANIC COMPOUNDS; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

MOLECULAR ALIGNMENTS;

THIN FILMS;

EID: 0141843663     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)01021-6     Document Type: Article

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