Relating substitution to single-chain conformation and aggregation in Poly(p-phenylene Vinylene) films

Nano Letters

Volumn 3, Issue 9, 2003, Pages 1191-1196

  Kemerink, M ^a   Van Duren, J K J ^a   Jonkheijm, P ^a   Pasveer, W F ^a,b   Koenraad, P M ^a   Janssen, R A J ^a   Salemink, H W M ^a   Wolter, J H ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALKENE DERIVATIVE; METAL; POLY(4 PHENYLENE VINYLENE); POLYMER; UNCLASSIFIED DRUG;

ARTICLE; CONFORMATION; FILM; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; MOLECULAR MODEL; OSCILLATION; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY;

EID: 0141796269     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl034317j     Document Type: Article

References (19)

1. Cornil, J.; Beljonne, D.; Calbert, J.-P.; Brédas, J.-L. Adv. Mater. 2001, 13, 1053.
2. Nguyen, T.-Q.; Schwartz, B. J.; Schaller, R. D.; Johnson, J. C.; Lee, L. F.; Haber, L. H.; Saykally, R. J. J. Phys. Chem. B 2001, 105, 5153.
3. Tan, C. H.; Inigo, A. R.; Hsu, J.-H.; Fann, W.; Wei, P. K. J. Phys. Chem. Solids 2001, 62, 1643.
4. Blatchford, J. W.; Gustafson, T. L.; Epstein, A. J.; Vanden Bout, D. A.; Kerimo, J.; Higgins, D. A.; Barbara, P. F.; Fu, D.-K.; Swager, T. M.; MacDiarmid, A. G. Phys. Rev. B 1996, 54, 3683.
5. Sirringhaus, H.; Brown, P. J.; Friend, R. H.; Nielsen, M. M.; Bechgaard, K.; Langeveld-Voss, B. M. W.; Spiering, A. J. H.; Janssen, R. A. J.; Meijer, E. W.; Herwig, P.; de Leeuw, D. M. Nature 1999, 401, 685.
6. Hassenkam, T.; Greve, D. R.; Bjørnholm, T. Adv. Mater. 2001, 13, 631.
7. Martens, H. C. F.; Blom, P. W. M.; Schoo, H. F. M. Phys. Rev. B 2000, 61, 7489.
8. Becker, H.; Spreitzer, H.; Kreuder, W.; Kluge, E.; Schenk, H.; Parker, I.; Cao, Y. Adv. Mater. 2000, 12, 42.
9. As these tings show some similarity to a well-known artifact in phase images that results from improper feedback operation, usually due to too fast scanning, it should explicitly be pointed out that these rings are independent of scan parameters. In addition, the artifact rings center around topographic maxima, which the rings in Figure 1b do not.
10. HyperChem V7.04, Molecular Modeling System, Hypercube, Inc., using MM+ force fields.
11. Hu, D.; Yu, J.; Wong, K.; Bagchi, B.; Rossky, P. J.; Barbara, P. F. Nature 2000, 405, 1030.
12. Following Mehta, A.; Kumar, P.; Dadmun, M. D.; Zheng, J.; Dickson, R. M. ; Thundat, T.; Sumpter, B. G.; Barnes, M. D. Nano Lett. 2003, 3, 603, each chain was heated from 300 to 600 K in 1 ps, followed by 3 ps at 600 K and 3 ps cooling-down to 300 K. Subsequently, an energy minimization step was performed. The energies mentioned in the text are per monomer and calculated after this last step.
13. Other interactions have also been considered. In particular, the Coulomb force between charge on the sample, either fixed or induced by the work function difference between tip and sample, and the metallic tip can be of equal strength as the van der Waals force. Nevertheless, this can be excluded since the bias dependence predicted by such models is not observed.
14. Bustamante, C.; Keller, D. Phys. Today 1995, 48, 32.
15. Hamaker, H. C. Physica 1937, IV, 1058.
16. Boer, E. A.; Bell, L. D.; Brongersma, M. L.; Atwater, H. A. J. Appl. Phys. 2001, 90, 2764.
17. Argento, C.; French, R. H. J. Appl. Phys. 1996, 80, 6081.
18. Kittel, C. In Introduction to solid-state physics, 6th ed.; Wiley: New York, 1986.
19. Sutherland, D. G. J.; Carlisle, J. A.; Elliker, P.; Fox, G.; Hagler, T. W.; Jimenez, I.; Lee, H. W.; Pakbaz, K.; Terminello, L. J.; Williams, S. C.; Himpsel, F. J.; Shuh, D. K.; Tong, W. M.; Jia, J. J.; Callcott, T. A.; Ederer, D. L. Appl. Phys. Lett. 1996, 68, 2046.