A statistical sampler for a new on-line analog test method

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 19, Issue 5, 2003, Pages 585-595

  Negreiros, Marcelo ^a   Carro, Luigi ^a   Susin, Altamiro A ^a  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

Analog test; DSP based testing; On line testing

Indexed keywords

BUILT-IN SELF TEST; COMPUTER SIMULATION; DIGITAL SIGNAL PROCESSING; FAST FOURIER TRANSFORMS; MICROPROCESSOR CHIPS; PERFORMANCE; STATISTICAL METHODS; TRANSFER FUNCTIONS;

ANALOG CIRCUITS; CIRCUIT UNDER TEST; ON-LINE TESTING; SOFTWARE PACKAGE MATLAB; SYSTEM-ON-CHIP;

INTEGRATED CIRCUIT TESTING;

EID: 0141742103     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1025182115706     Document Type: Article

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