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Volumn 68, Issue 3-4, 2003, Pages 339-343
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Positron and positronium annihilation in silica-based thin films studied by a pulsed positron beam
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Author keywords
AMOC; Low k; PALS; Porous material; Positronium; SiO2; Three gamma annihilation
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Indexed keywords
POSITRONS;
SILICA;
SURFACE PHENOMENA;
POSITRONIUM ANNIHILATION;
THIN FILMS;
CARBON;
HYDROGEN;
SILICON DIOXIDE;
CONFERENCE PAPER;
CORRELATION ANALYSIS;
DIELECTRIC CONSTANT;
ELECTRON;
FILM;
POROSITY;
POSITRON;
POSITRONIUM;
SPECTROSCOPY;
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EID: 0141721284
PISSN: 0969806X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0969-806X(03)00181-6 Document Type: Conference Paper |
Times cited : (12)
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References (8)
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