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Volumn 58, Issue 5-6, 2000, Pages 777-780
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Can a newly developed AMOC technique be applied to determine the para-positronium lifetime?
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
GAMMA RAYS;
KINETIC ENERGY;
MAGNETIC FIELD EFFECTS;
SCINTILLATION COUNTERS;
SILICA;
MAGNETIC QUENCHING EFFECT;
PARAPOSITRONIUM LIFETIME;
POSITRON AGE MOMENTUM CORRELATION TECHNIQUE;
TIME DEPENDENT LINE SHAPE PARAMETER;
POSITRONS;
SILICON DIOXIDE;
APPARATUS;
CONFERENCE PAPER;
DEGRADATION;
DESTRUCTION;
ENERGY;
GAMMA IRRADIATION;
LIFESPAN;
POSITRON;
POSITRONIUM;
TECHNIQUE;
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EID: 0034214268
PISSN: 0969806X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0969-806X(00)00258-9 Document Type: Conference Paper |
Times cited : (8)
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References (8)
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