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Volumn 21, Issue 4, 2003, Pages 1453-1458

Electron-beam lithography for thick refractive optical elements in SU-8

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; ELECTRON SCATTERING; LIGHT REFRACTION; PHOTORESISTS; SURFACE PROPERTIES;

EID: 0141681261     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1593639     Document Type: Conference Paper
Times cited : (19)

References (16)
  • 15
    • 0141783228 scopus 로고    scopus 로고
    • Microchem Corp., Newton, MA
    • Microchem Corp., Newton, MA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.