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Volumn 50, Issue 9, 2003, Pages 1216-1220
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High Fan-in Dynamic CMOS Comparators with Low Transistor Count
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Author keywords
Build in self test (BIST); Dynamic comparator; High fan in; Testing; Zero one detector
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Indexed keywords
ELECTRIC POWER UTILIZATION;
MICROPROCESSOR CHIPS;
TRANSISTORS;
DYNAMIC COMPARATOR;
CMOS INTEGRATED CIRCUITS;
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EID: 0141638642
PISSN: 10577122
EISSN: None
Source Type: Journal
DOI: 10.1109/TCSI.2003.816338 Document Type: Article |
Times cited : (22)
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References (10)
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