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1
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0011304611
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Depth-scanning fringe projection for absolute 3-D profiling
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K. Körner, U. Droste, R. Windecker, M. Fleischer, H. Tiziani, T. Bothe, W. Osten, "Depth-Scanning Fringe Projection for absolute 3-D profiling", Proc. Fringe'01, Elsevier, Paris, 2001, p. 394-401.
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Proc. Fringe'01, Elsevier, Paris, 2001
, pp. 394-401
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Körner, K.1
Droste, U.2
Windecker, R.3
Fleischer, M.4
Tiziani, H.5
Bothe, T.6
Osten, W.7
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2
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0036421090
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Reverse engineering by fringe projection
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J. Burke, T. Bothe, W. Osten, C. Hess: "Reverse engineering by fringe projection". Proc. SPIE Vol.4778, 2002, pp. 312-324.
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(2002)
Proc. SPIE
, vol.4778
, pp. 312-324
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Burke, J.1
Bothe, T.2
Osten, W.3
Hess, C.4
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3
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0033895371
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Overview of three-dimensional shape measurement using optical methods
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F. Chen, G.M. Brown, M. Song: "Overview of three-dimensional shape measurement using optical methods", Opt. Eng.; 39:10-22 (2000)
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(2000)
Opt. Eng.
, vol.39
, pp. 10-22
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Chen, F.1
Brown, G.M.2
Song, M.3
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5
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0036421192
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Compact 3D-Camera
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T. Bothe, W. Osten, A. Gesierich, W. Jüptner: "Compact 3D-Camera", Proc. SPIE Vol.4778, 2002, pp. 48-59.
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(2002)
Proc. SPIE
, vol.4778
, pp. 48-59
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Bothe, T.1
Osten, W.2
Gesierich, A.3
Jüptner, W.4
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7
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0034291373
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Geometric camera calibration using circular control points
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J. Heikkilä, "Geometric Camera Calibration using Circular Control Points," IEEE Trans. Pattern Analysis and Machine Intelligence 22(10), 1066 - 1077 (2000).
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(2000)
IEEE Trans. Pattern Analysis and Machine Intelligence
, vol.22
, Issue.10
, pp. 1066-1077
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Heikkilä, J.1
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8
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4444356752
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Generation and evaluation of object adapted inverse fringe patterns
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T. Bothe, W. Li, W. Osten, W. Jüptner: "Generation and evaluation of object adapted inverse fringe patterns", International Symposium on Photonics in Measurement, VDI Berichte 1694, 2002, 299-304
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International Symposium on Photonics in Measurement, VDI Berichte 1694, 2002
, pp. 299-304
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Bothe, T.1
Li, W.2
Osten, W.3
Jüptner, W.4
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9
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0141842496
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Object adapted pattern projection - Part I: Generation of inverse patterns
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accepted to be published in
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W. Li, T. Bothe, W. Osten: "Object Adapted Pattern Projection - part I: generation of inverse patterns," Opt. and Lasers in Eng., accepted to be published in 2003
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(2003)
Opt. and Lasers in Eng.
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-
Li, W.1
Bothe, T.2
Osten, W.3
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10
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0141731130
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Object adapted pattern projection - Part II: Applications
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prep. for
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T. Bothe, W. Li, W. Jüptner: "Object Adapted Pattern Projection - part II: applications", OLE, prep. for 2003
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(2003)
OLE
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Bothe, T.1
Li, W.2
Jüptner, W.3
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11
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0141608736
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Applications for inverse pattern projection
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W. Li, T. Bothe, M. Kalms, C. vonKopylow, W. Jüptner: "Applications for Inverse Pattern Projection". Proc. SPIE Vol.5144, 2003
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(2003)
Proc. SPIE
, pp. 5144
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Li, W.1
Bothe, T.2
Kalms, M.3
VonKopylow, C.4
Jüptner, W.5
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12
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4444356984
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An integrated measurement system for the inspection of extended surfaces in industrial quality control
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D. Kayser, T. Bothe, W. Osten: "An integrated measurement system for the inspection of extended surfaces in industrial quality control", Proc. Intern Symposium Photonics in Measurement. VDI-Berichte 1694, Düsseldorf 2002, pp. 339-344.
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Proc. Intern Symposium Photonics in Measurement. VDI-Berichte 1694, Düsseldorf 2002
, pp. 339-344
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Kayser, D.1
Bothe, T.2
Osten, W.3
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