Applications for inverse pattern projection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5144, Issue , 2003, Pages 492-503

  Li, Wansong ^a   Bothe, Thorsten ^a   Kalms, Michael ^a   Von Kopylow, Christoph ^a   Jüptner, Werner ^a  

^a BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

Author keywords

Absolute phase measurement; Augmented reality; High speed dynamic measurement; Incremental measurement; Inverse fringe projection; Inverse phase shift

Indexed keywords

ALGORITHMS; CAMERAS; FOURIER TRANSFORMS; INSPECTION; MAPPING; MOIRE FRINGES; OPTICAL PROJECTORS; OPTIMIZATION; THREE DIMENSIONAL;

ABSOLUTE PHASE MEASUREMENT; AUGMENTED REALITY; HIGH SPEED DYNAMIC MEASUREMENT; INCREMENTAL MEASUREMENT; INVERSE PATTERN PROJECTION; INVERSE PHASE SHIFT;

SPATIAL VARIABLES MEASUREMENT;

EID: 0141608736     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.508367     Document Type: Conference Paper

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