Compact 3D-camera

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4778, Issue , 2002, Pages 48-59

  Bothe, Thorsten ^a   Osten, Wolfgang ^a   Gesierich, Achim ^a   Jüptner, Werner ^a  

^a BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

Author keywords

3 D shape measurement; Absolute phase measurement; Depth scanning; Fringe projection; Inverse projection; Miniaturization; Phase shifting; Structured light; Synthetic wavelengths

Indexed keywords

ALGORITHMS; LIGHT SOURCES; PHASE MEASUREMENT; PHASE SHIFT; PROJECTION SYSTEMS; SCANNING;

FRINGE PROJECTIONS;

CAMERAS;

EID: 0036421192     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.473573     Document Type: Article

References (7)

1. K. Körner, U. Droste, R. Windecker, M. Fleischer, H. Tiziani, T. Bothe, W. Osten, "Depth-Scanning Fringe Projection for absolute 3-D profiling", Proc. Fringe'01, Elsevier, Paris, 2001, p. 394-401.
2. J. Burke, T. Bothe, W. Osten, C. Hess: "Reverse engineering by fringe projection", Proc. SPIE, 2002, Volume 4778 (in this proceeding).
3. F. Chen, G.M. Brown, M. Song: "Overview of three-dimensional shape measurement using optical methods", Opt.Eng. 2000; 39:10-22.
4. W. Nadeborn, P. Andrä, W. Osten: "A robust procedure for absolute phase measurement", Opt. and Lasers in Eng. 24 (1996): 245-260.
5. H. Naumann, G. Schröder: "Bauelemente der Optik", Carl Hanser Verlag, Munich, 1987, 304-307.
6. G. Franke: "Photographische Optik", Akademische Verlagsgesellschaft, Frankfurt, 1964.
7. W. Li, T. Bothe, W. Osten: "Object Adapted Pattern Projection", to be published in OLE.