Interface separation in residually-stressed thin-film structures

Interface Science

Volumn 11, Issue 3, 2003, Pages 309-317

  Strohband, Sven ^a   Dauskardt, Reinhold H ^a  

^a Stanford University   (United States)

Author keywords

Cohesive stress; Debonding; Multilayer structures; Plasticity; Residual stress

Indexed keywords

COMPUTER SIMULATION; DEBONDING; FRACTURE; MATHEMATICAL MODELS; MULTILAYERS; PLASTICITY; RESIDUAL STRESSES; THIN FILMS; YIELD STRESS;

DUCTILE LAYERS; ELASTIC LAYERS; INTERFACE SEPARATION; INTERFACIAL FRACTURE ENERGY; INTERFACIAL FRACTURE RESISTANCE; MAXIMUM COHESIVE STRESS; THIN FILM STRUCTURES;

INTERFACES (MATERIALS);

EID: 0141519329     PISSN: 09277056     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1025196306794     Document Type: Article

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