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Volumn 5039 I, Issue , 2003, Pages 310-321

Quantum efficiency of PAG decomposition in different polymer matrices at advanced lithographic wavelengths

Author keywords

Dill C parameter; PAG decomposition; Photochemistry

Indexed keywords

COMPUTER SIMULATION; DECOMPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT ABSORPTION; MATHEMATICAL MODELS; OPTICAL PROPERTIES; ORGANIC POLYMERS; RATE CONSTANTS;

EID: 0141499950     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.483705     Document Type: Conference Paper
Times cited : (15)

References (11)
  • 4
    • 0029727394 scopus 로고    scopus 로고
    • Resist metrology for lithography simulation, part 1: Exposure parameter measurements
    • C. A. Mack, T. Matsuzawa, A. Sekiguchi, and Y. Minami, "Resist Metrology for Lithography Simulation, Part 1: Exposure Parameter Measurements," Proc. SPIE 2725, 34 (1996).
    • (1996) Proc. SPIE , vol.2725 , pp. 34
    • Mack, C.A.1    Matsuzawa, T.2    Sekiguchi, A.3    Minami, Y.4
  • 5
    • 0032653145 scopus 로고    scopus 로고
    • A FT-IR method to determine dill's C parameter for DNQ/novolac resists with e-beam and i-line exposure
    • T.H. Fedynyshyn, S.P. Doran, and C.A. Mack, "A FT-IR Method to Determine Dill's C Parameter for DNQ/Novolac Resists with e-beam and i-line Exposure", Proc. SPIE 3678, 1263 (1999).
    • (1999) Proc. SPIE , vol.3678 , pp. 1263
    • Fedynyshyn, T.H.1    Doran, S.P.2    Mack, C.A.3
  • 6
    • 0001403531 scopus 로고
    • Absorption and exposure in positive photoresist
    • C.A. Mack, "Absorption and Exposure in Positive Photoresist", Applied Optics 27, 4913 (1988).
    • (1988) Applied Optics , vol.27 , pp. 4913
    • Mack, C.A.1
  • 10
    • 0033707165 scopus 로고    scopus 로고
    • Determination of optical properties of thin films and surfaces in 157-nm lithography
    • V. Liberman, T. M. Bloomstein and M. Rothschild, "Determination of Optical Properties of Thin Films and Surfaces in 157-nm Lithography", Proc. SPIE 3998, 480 (2000).
    • (2000) Proc. SPIE , vol.3998 , pp. 480
    • Liberman, V.1    Bloomstein, T.M.2    Rothschild, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.