Simple metrics for slew rate of RC circuits based on two circuit moments

Proceedings - Design Automation Conference

Volumn , Issue , 2003, Pages 950-953

  Agarwal, Kanak ^a   Sylvester, Dennis ^a   Blaauw, David ^a  

^a NONE

Author keywords

Design; Performance

Indexed keywords

ERRORS; MICROPROCESSOR CHIPS; OPTIMIZATION; PERFORMANCE; PROBABILITY DENSITY FUNCTION;

CUMULATIVE DENSITY FUNCTION (CDF);

ELECTRIC NETWORK ANALYSIS;

EID: 0043136429     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775832.776070     Document Type: Conference Paper

References (12)

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