Atomistic measures of materials strength

CMES - Computer Modeling in Engineering and Sciences

Volumn 3, Issue 2, 2002, Pages 219-227

  Li, Ju ^a   Yip, Sidney ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

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[No Author keywords available]

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EID: 0042964874     PISSN: 15261492     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (35)

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